Publikationen in Fachzeitschriften
2023
A. Wählisch, M. Wansleben, J. Weser, C. Stadelhoff, I. Holfelder, Y. Kayser, B. Beckhoff, Experimental determination of differential scattering coefficients for nickel by means of linearly polarized X-ray radiatio, Metrologia 60 (2023), 035001
2021
I. Holfelder, M. Wansleben, Y. Kayser, R. Gnewkow, M. Müller, J. Weser, C. Zech, B. Beckhoff, A double crystal von Hamos spectrometer for traceable X-ray emission spectroscopy, Rev. Sci. Instrum. 92(12) (2021)
2020
I. Holfelder, J. Fliegauf, Y. Kayser, M. Müller, M. Wansleben, J. Weser, B. Beck- hoff, A compact and calibratable von Hamos X-Ray Spectrometer based on two full-cylinder HAPG mosaic crystals for high energy-resolution XES and RIXS, Proceedings of the 20th International conference of the European Society for Precision Engineering and Nanotechnology (euspen) (2020)
F. Peinl, I. Holfelder, J. Weser, B. Beckhoff, J. Lubeck, Analysis of vibration- based degradation of the spatial resolution of a nanometer-X-ray fluorescence analysis setup, Proceedings of the 20th International conference of the Euro- pean Society for Precision Engineering and Nanotechnology (euspen) (2020)
2019
M. Wansleben, Y. Kayser, P. Hönicke, I. Holfelder, A. Wählisch, R. Unterums- berger, B.Beckhoff, Experimental determination of line energies, line widths and relative transition probabilities of the Gadolinium L x-ray emission spect- rum, Metrologia 56 (2019), 065007
2018
I. Holfelder, (2018), Entwicklung eines hochauflösenden wellenlängendispersi- ven Spektrometers für den Spektralbereich harter Röntgenstrahlung, (Disserta- tion, Maschinenbau). Fraunhofer Verlag, Stuttgart
M. Wansleben, J. Vanson, I. Holfelder, Y. Kayser, B. Beckhoff,
Valence-to-core X-ray emission spectroscopy of Ti, TiO and TiO2 by means of a double full-cylinder crystal von hamos spectrometer, X-ray Spectrometry (2018), 1-5
I. Holfelder, J. Fliegauf, Y. Kayser, M. Müller, M. Wansleben, J. Weser, B. Beck- hoff, A compact and calibratable von Hamos X-ray spectrometer based on two full-cylinder HAPG mosaic crystals for high-resolution XES, Proceedings of the 10th international conference MEDSI (2018), WEOPMA06
2017
P. Hönicke, I. Holfelder, M. Kolbe, J. Lubeck, B. Pollakowski, R. Unter- umsberger, J. Weser, B. Beckhoff, Determination of SiO2 and C layers on a monocrystalline silicon sphere by reference - free X-ray fluorescence analysis, Metrologia (2017) 54, 481 – 486
J. Lubeck, M. Bogovac, B. Boyer, B. Detlefs, D. Eichert, R. Fliegauf, D. Grötzsch, I. Holfelder, P. Hönicke, W. Jark, R. B. Kaiser, B. Kanngießer, A. G. Karydas, J. J. Leani, M. C. Lépy, L. Lühl, Y. Ménesguen, A. Migliori, M. Müller, B. Pollakowski, M. Spanier, H. Sghaier, G. Ulm, J. Weser, B. Beckhoff1, A new generation of x- ray spectrometry UHV instrumentation at the SR facilities BESSY II, ELLETRA an SOLEIL, AIP Conference Proceedings 1741 (2016), 030011
2016
R. Fliegauf, B. Beckhoff, E. Beyer, E. Darlatt, I. Holfelder, P. Hönicke, G. Ulm, M. Kolbe, Surface characterization of silicon spheres by combined XRF and XPS analysis for determination of the Avogadro constant, Conf. on Precision Elec- tromagnetic Measurements (2016)
2015
M. Gerlach, L. Anklamm, A. Antonov, I. Grigorieva, I. Holfelder, B. Kanngießer, H. Legall, W. Malzer, C. Schlesiger, B. Beckhoff, Characterization of HAPG mo- saic crystals using synchrotron radiation, J. Appl. Crystallogr. 48(5) (2015), 1381-1390
2014
M. Müller, M. Gerlach, I. Holfelder, P. Hönicke, B. Beckhoff, X-ray Spectrometry with Syncrontron Radiation, PTB Mitteilungen 124 (2014), 207 – 211
2013
I. Holfelder, A. Nutsch, P. Hönicke, B. Beckhoff, G. Roeder, P. Petrik, R. Fliegauf, J. Weser, Complementary methodologies for thin film characterization in one tool - a novel instrument for 450 mm wafers, J. Anal. At. Spectrom. 28(4) (2013), 549-557
J. Lubeck, B. Beckhoff, R. Fliegauf, I. Holfelder, P. Hönicke, M. Müller, B. Pol- lakowski, F. Reinhardt, J. Weser, A novel instrument for quantitative nanoana- lytics involving complementary X-ray methodologies, Rev. Sci. Instrum. 84 (2013), 045106
Konferenzbeiträge
2020
I. Holfelder, J. Fliegauf, Y. Kayser, M. Müller, M. Wansleben, J. Weser, B. Beck- hoff, A compact and calibratable von Hamos X-Ray Spectrometer based on two full-cylinder HAPG mosaic crystals for high energy-resolution XES and RIXS, Proceedings of the 20th International conference of the European Society for Precision Engineering and Nanotechnology (euspen) (2020)
2018
Berlin, Deutschland, OpticBB Workshop on micro spectrometer: A compact and calibratable von Hamos X-ray spectrometer based on two full-cylinder HAPG mosaic crystals for high-resolution XES
Frascati, Italien, IFNI2018 High Precision X-ray measurements: A compact and calibratable von Hamos X-ray spectrometer based on two full-cylinder HAPG mosaic crystals for high-resolution XES
Paris, Frankreich, Mechanical engineering design of synchrotron radiation equipment and instrumentation MEDSI2018: A compact and calibratable von Hamos X-ray spectrometer based on two full-cylinder HAPG mosaic crystals for high-resolution XES
2017
Straßburg, Frankreich, Analytical echniques for precise characterization of nano materials ALTECH 2017: A compact and calibratable von Hamos X-ray spectrometer based on two full-cylinder HAPG mosaic crystals for high- resolution XES
2016
Göteborg, Schweden, European Conference on X-ray Spectrometry EXRS2016: A compact and calibratable von Hamos X-ray spectrometer based on two full- cylinder HAPG mosaic crystals for high-resolution XES
2013
Berlin, Deutschland, Fachtagung Prozessnahe Röntgenanalytik PRORA2013: EEMI450 und Nanoanalytik
